ESA Radiation Test Database
The esarad.esa.int database is public and open to the Industry, with the aim of sharing data within the radiation effects community. ESA Member States Companies and Organizations can register, log in and access the reports.
Due to its public nature, the esarad.esa.int database does not contain confidential reports.
Which EEE components would you like to see in the ESA Radiation Test Database?
The Radiation and Component reliability section (TEC-EDR) at the European Space Agency is gathering industry inputs on possible components of interest. Please submit your inputs here: Electronics components Radiation testing - pilot survey (link)
The requests shall remain confidential with ESA and test data from selected components will be shared on esarad.esa.int
Any user can be a contributor to the database:
To contribute to the database please send them to this e-mail address. Their publication will be subjected to ESA-TEC-EDR approval.
Note: when sending a report, the user should specify in their email whether the document is ‘FOR PUBLIC USE’ or ‘ESA INTERNAL ONLY’. If the former is chosen, the report will be available internally on the ESA Intranet but not on the public website. Oppositely, the latter option will make the report publicly available.
DISCLAIMER
The information contained herein is presented for informational purposes only. ESA does not make, and disclaims, any representation or warranty, express or implied, of the correctness and completeness of this information, and its fitness for a particular purpose. This information does not constitute or imply an ESA endorsement or approval for the use of any tested part in ESA activities or third-party activities. In particular, but without limitation, this is due to traceability which cannot be guaranteed on commercial components but is an important prerequisite for the reusability of TID, TNID and SEE radiation test results. The information herein can therefore not be reused without further justifications which may vary depending on the type of space activity concerned. Reproduction of parts of the test summary is authorised on the condition that clear reference is made to the test report number and this disclaimer. ESA reserves the right to alter, revise, or rescind this document due to subsequent developments or additional test results. ESA intends, but cannot guarantee, that the ESARAD database always contains latest versions of the test reports.
Id | DUT part type | DUT Manufacturer | Report File | Radiation Test Type | Radiation Test Method | EPPL Familiy | EPPL Group | Function | Technology | Report Source | Report Date | |
---|---|---|---|---|---|---|---|---|---|---|---|---|
402 | LTC4361CTS8 | Analog Devices |
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SEE (Single Events Effects) |
ESCC 25100 Laser testing |
8 MICROCIRCUITS | 90 OTHER FUNCTIONS | Overvoltage/Overcurrent Protection Controller | TRAD | 21/08/2024 | False | |
403 | MAX823TEUK+ | Maxim Integrated |
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|
SEE (Single Events Effects) |
ESCC 25100 Laser testing |
8 MICROCIRCUITS | 90 OTHER FUNCTIONS | 5-Pin Microprocessor Supervisory Circuits with Watchdog Timer and Manual Reset | TRAD | 20/08/2024 | False | |
405 | MAX4840AEXT+ | Maxim Integrated |
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|
SEE (Single Events Effects) |
ESCC 25100 Laser testing |
8 MICROCIRCUITS | 90 OTHER FUNCTIONS | Overvoltage-Protection Controllers with Status FLAG | TRAD | 20/08/2024 | False | |
404 | MAX890LESA+ | Maxim Integrated |
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|
SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 90 OTHER FUNCTIONS | 1.2A, Current-Limited, High-Side P-Channel Switch with Thermal Shutdown | TRAD | 23/06/2024 | False | |
386 | BD9P205EFV-CE2 | Rohm Semiconductor |
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|
SEE (Single Events Effects) | ESCC 25100 | 9 SWITCHING | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False | |
389 | L6982 | STmicroelectronics |
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|
SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 59 LINEAR SWITCHES | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
390 | LMR38020 | Texas Instruments |
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|
SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 59 LINEAR SWITCHES | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
391 | LT8610AC | Linear Technology |
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SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
392 | LT7101 | Linear Technology |
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SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
393 | BD9P205EFV-CE2 | Rohm Semiconductor |
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|
TID (Total Ionising Dose) | Not specified | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
394 | L6982 | ST Microelectronics |
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TID (Total Ionising Dose) | Not specified | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | ESA-ESTEC TEC-QEC | 21/02/2024 | False | |
395 | LMR38020 | Texas Instruments |
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TID (Total Ionising Dose) | Not specified | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
396 | LT8610AC | Analog Devices |
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TID (Total Ionising Dose) | Not specified | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
397 | ST1S40 | ST Microelectronics |
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TID (Total Ionising Dose) | Not specified | 8 MICROCIRCUITS | 54 LINEAR SWITCHING REGULATOR | Buck Converter | Silicon | ESA-ESTEC TEC-QEC | 21/02/2024 | False |
413 | TPS25940ARVCR | Texas Instruments |
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SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 90 OTHER FUNCTIONS | 2.7 - 18V eFuse with True Reverse Blocking and DevSleep Support for SSDs | TRAD | 04/01/2024 | False | |
409 | LTC4222CG | Linear Technology |
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|
SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 90 OTHER FUNCTIONS | Dual Hot Swap Controller with I²C Compatible Monitoring | TRAD | 20/12/2023 | False | |
412 | INA226AIDGSR | Texas Instruments |
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SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 90 OTHER FUNCTIONS | High-Side or Low-Side Measurement, Bi-Directional Current and Power Monitor | TRAD | 20/12/2023 | False | |
411 | TPS3820-33DBV | Texas Instruments |
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|
SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 90 OTHER FUNCTIONS | Voltage Monitor With Watchdog Timer | TRAD | 18/12/2023 | False | |
408 | LT6108IMS8 | Linear Technology |
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SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 69 LINEAR OTHER FUNCTIONS | High Side Current Sense Amplifier wih Reference and Comparator | TRAD | 15/12/2023 | False | |
410 | MAX17523ATE+ | Analog Devices |
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SEE (Single Events Effects) | ESCC 25100 | 8 MICROCIRCUITS | 90 OTHER FUNCTIONS | 4.2V to 36V, 1A Current Limiter with OV, UV, Reverse Voltage Protection | TRAD | 15/12/2023 | False |